We report the ionic liquid (IL) gating of a solution processed semiconducting polymer, poly(2,5-bis(3-hexadecylthiophen-2-yl)thieno[3,2-b]thiophene) (PBTTT). IL gating relies on the poor solubility of PBTTT, which requires hot chlorinated benzenes for solution processing. PBTTT, thus, resists dissolution even in IL, which otherwise rapidly dissolves semiconducting polymers. The resulting organic thin film transistors (OTFTs) display low threshold, very high carrier mobility (>3 cm2/Vs), and deliver high currents (in the order of 1 mA) at low operational voltages. Such OTFTs are interesting both practically, for the addressing of current-driven devices (e.g., organic LEDs), and for the study of charge transport in semiconducting polymers at very high carrier density.
J. Mater. Chem. C, 2014, 2,4289-4296DOI: 10.1039/C3TC32276A, PaperChang Guo, Bin Sun, Jesse Quinn, Zhuangqing Yan, Yuning LiIndigo is used as an electron acceptor for constructing polymer semiconductors that show n-channel behaviour in organic thin film transistors.The content of this RSS Feed (c) The Royal Society of Chemistry
A series of Zn x Fe3− x O4 (ZFO, x = 0.4) thin films were epitaxially deposited on single-crystal (001)-SrTiO3 (STO) substrates by radio frequency magnetron sputtering. The anomalous thickness-dependent strain states of ZFO films were found, i.e., a tensile in-plane strain exists in the thinner ZFO film and which monotonously turns into compressive in the thicker films. Considering the lattice constant of bulk ZFO is bigger than that of STO, this strain state cannot be explained in the conventional framework of lattice-mismatch-induced strain in the hetero-epitaxial system. This unusual phenomenon is proposed to be closely related to the Volmer-Weber film growth mode in the thinner films and incorporation of the interstitial atoms into the island's boundaries during subsequent epitaxial growth of the thicker films. The ZFO/STO epitaxial film is found in the nature of magnetic semiconductor by transport measurements. The in-plane magnetization of the ZFO/STO films is found to increase as the in-plane compressive strain develops, which is further proved in the (001)-ZFO/PMN-PT film where the film strain state can be in situ controlled with applied electric field. This compressive-strain-enhanced magnetization can be attributed to the strain-mediated electric-field-induced in-plane magnetic anisotropy field enhancement. The above results indicate that strain engineering on magnetic oxide semiconductor ZFO films is promising for novel oxide-electronic devices.
In–Ga–Zn oxide (IGZO) is a next-generation semiconductor material seen as an alternative to silicon. Despite the importance of the controllability of characteristics and the reliability of devices, defects in IGZO have not been fully understood. We investigated defects in IGZO thin films using electron spin resonance (ESR) spectroscopy. In as-sputtered IGZO thin films, we observed an ESR signal which had a g-value of g = 2.010, and the signal was found to disappear under thermal treatment. Annealing in a reductive atmosphere, such as N2 atmosphere, generated an ESR signal with g = 1.932 in IGZO thin films. The temperature dependence of the latter signal suggests that the signal is induced by delocalized unpaired electrons (i.e., conduction electrons). In fact, a comparison between the conductivity and ESR signal intensity revealed that the signal's intensity is related to the number of conduction electrons in the IGZO thin film. The signal's intensity did not increase with oxygen vacancy alone but also with increases in both oxygen vacancy and hydrogen concentration. In addition, first-principle calculation suggests that the conduction electrons in IGZO may be generated by defects that occur when hydrogen atoms are inserted into oxygen vacancies.
Abstract We investigated oxidized SiN gate oxides that have undergone post-oxidation annealing (POA) treatment using diluted O2 (10% O2 in N2) at 1100 °C. The oxidized SiN/SiC interfaces were characterized by using capacitance-voltage (C-V) measurements, Auger electron spectroscopy (AES), high-resolution transmission electron microscopy (HR-TEM), and X-ray photoelectron spectroscopy (XPS). POA for 60 min significantly improved the interface trap density (D it ), near-interface trap density (N it ), and effective oxide charge density (Q eff ) of the oxidized SiN. However, improvement was not observed for the as-oxidized SiN sample or the oxidized SiN sample that had undergone POA for 120 min. The electrical properties of metal-oxide semiconductor devices fabricated using these oxides are discussed in terms of the oxide chemical composition.